The material subsequently undergoes an artificial aging treatment.
In the aging process, an artificial aging treatment is applied to the large number of the aluminum die-cast products came out through the quenching process.
In one aspect, a method for producing the alloy includes preparing an aluminum alloy for artificial aging and artificially aging the alloy.
The invention relates to a method and a device for mechanically treating concrete blocks (10) in order to bring about an artificial aging process.
During formation of the alloys, homogenization, solution heat treating and artificial aging processes are preferably employed.
The method includes carrying out a succession of at least two artificial ageing steps.
A method for the artificial ageing of fabrics by applying an enzyme compound without using an aqueous bath.
The joints may be both heat treated and artificially aged or naturally aged.
Multiple daughter boards (82) can then be mounted to the mother board (10) for burn-in testing using standard burn-in ovens.
The probe is used for burn-in of integrated circuits at the wafer level.
It contains aluminium and, during the burn-in process, provides good ohmic contact.
The circuit has less sensitivity to aging of components that cause a shift in operating frequency.
Burn-in testing of the bare die has the benefit of saving packaging efforts.
The mother board (10) allows each die (14) to be tested separately for speed and functionality and to also be burn-in tested in parallel using standard burn-in ovens.
A temperature control device (48) is used to heat the wafer (40) during an oxide reduction process or during burn-in of the wafer.
An apparatus and method for testing a socket (16) on a burn-in board (18) using a flex strip probe (12).
This invention relates to a method for artificially aging 7000 Series Al aerospace alloys to impart improved strength and/or corrosion resistance performance thereto.
Using a Z-axis material (12'), a bare die (36) can be burn-in tested without first packaging the die.
Methods and specially adapted reusable test carriers provide for burn-in test of semiconductor integrated circuit devices.
A method of heat treating an aluminium-lithium alloy is provided.
Applying a voltage, such as a burn-in voltage, to the structure converts at least one of the breakdown paths to a conducting path (103, 280).
The process comprises solid solution heat treating the article, quenching the article, heating the article the a first temperature of from about 275 to about 340°F and artifically aging.