Disclosed is a compound microscope device (1) which is provided with a transmissive electron microscope (2), and an optical microscope (4).
An electron microscope is described.
The system (10) includes a scanning electron microscope (18) and a processing unit (14) connected to the scanning electron microscope (18).
The invention relates to a method of forming sections for inspection in an electron microscope and a fluorescent light microscope.
A transmission electron microscope has a target body position on the electron optical axis of the microscope, and an electrically conductive body off the axis of the microscope.
A scanning electron microscope, a focused ion-beam microscope (10), or a microscope having both beams (120, 130), also has an optical microscope (140).
A means or artefact for calibrating the height/depth or Z axis of a microscope, such as a confocal microscope, an interference microscope or a Scanning Electron Microscope.
A method is described of viewing a single tissue sample with a light microscope and an electron microscope.
critical dimension scanning electron microscope
The invention can be used for a transmission electron microscope.
Vibrations of the specimen in a SEM may lead to a serious reduction of the resolution that can be achieved by means of the SEM.