A manufacturing defect which causes a memory cell load device to be non-functional is frequently difficult to test.
A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board.
This provides at least the advantage that a signature matching capability allows an Operator to more accurately identify a root manufacturing cause of a wafer defect.
A system (100) and method for analyzing vibrations signals thereby identifying damage or original manufacture defects in a vibrating device.
The HOE control bit is made to have a factory default (non-activated state) that is enabled, so that prior to activation the mobile station is permitted to camp only on the home system.