The method further includes collecting the race condition testing data and evaluating the collected race condition testing data.
The race condition testing data is correlated to a process variation of the at least one die.
In a particular embodiment, the method includes operating a circuit at multiple supply voltage levels to generate race condition testing data.
A method (100) is provided for detecting a race condition of a parallel task when accessing a shared resource (403) in a multi-core processing system.
A second aspect of the invention relates to a method to be implemented in a mobility anchor node, which detects whether a race condition between registration messages occurs and resolves the most recent location of a mobile node.
The circuit is disposed on at least one die of a wafer and includes at least one racing path circuit having at least two paths.